BS EN 160200-2-1998 电子元器件质量评定协调体系.分规范:经质量评定的微波模数电子器件.试验方法索引
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【英文标准名称】:Harmonizedsystemofqualityassessmentforelectroniccomponents-Sectionalspecification-Microwavemodularelectronicunitsofassessedquality-Indexoftestmethods
【原文标准名称】:电子元器件质量评定协调体系.分规范:经质量评定的微波模数电子器件.试验方法索引
【标准号】:BSEN160200-2-1998
【标准状态】:现行
【国别】:英国
【发布日期】:1998-03-15
【实施或试行日期】:1998-03-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Lists;Microwavetransistors;Microwaves;Modules;Quality;Qualityassurance;Sectionalspecification;Testing
【摘要】:ThisPart2oftheSectionalSpecificationEN160200definesstandard/referencetestmethodsforElectrical,MechanicalandVisualInspectionasprescribedinPart1oftheSectionalSpecificationEN160200andBlankDetailSpecificationEN160201forMicrowaveModularElectronicUnits(MMEUs).SectionthreeofEN160200-1detailsgeneralrequirementsfortestandmeasurementprocedures(includingenvironmentaltestrequirements).ThisStandardspecifiesawiderangeofdocumentswhichrelatetomicrowavetestmethods.ManyofwhicharenotcoveredbyIECorCECCspecifications.AlthoughanumberoftestmethodsareunderpreparationbyIECandCECCtheyareconsideredacceptableforuseinthisStandard.WheretestmethodshavebeenconsideredsuitableforinsertionintothisStandardtheyareeitherreferencedunderclause2.4-StandardTestMethodsordetailedinfullunderclause2.5-SpecialTestMethods.ExamplesofMMEUswhicharecoveredbythesetestmethodsare:-Amplifiers-Attenuators-Couplers/Powerdividers-Filters-Isolators/Circulators-Limiters-Mixers-NoiseSources-Oscillators-PhaseShifters-Switches-Transmitters(e.g.IntegratedMultichannel)GuidanceontheprimeelectricalcharacteristicstobemeasuredisgiveninannexCoftheBlankDetailSpecification(BDS)-EN160201.ThisPart2ofEN160200willbereviewedasothertestmethodsbecomeavailable.
【中国标准分类号】:L10
【国际标准分类号】:31_190
【页数】:88P;A4
【正文语种】:英语
【原文标准名称】:电子元器件质量评定协调体系.分规范:经质量评定的微波模数电子器件.试验方法索引
【标准号】:BSEN160200-2-1998
【标准状态】:现行
【国别】:英国
【发布日期】:1998-03-15
【实施或试行日期】:1998-03-15
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Electricalengineering;Electronicengineering;Electronicequipmentandcomponents;Lists;Microwavetransistors;Microwaves;Modules;Quality;Qualityassurance;Sectionalspecification;Testing
【摘要】:ThisPart2oftheSectionalSpecificationEN160200definesstandard/referencetestmethodsforElectrical,MechanicalandVisualInspectionasprescribedinPart1oftheSectionalSpecificationEN160200andBlankDetailSpecificationEN160201forMicrowaveModularElectronicUnits(MMEUs).SectionthreeofEN160200-1detailsgeneralrequirementsfortestandmeasurementprocedures(includingenvironmentaltestrequirements).ThisStandardspecifiesawiderangeofdocumentswhichrelatetomicrowavetestmethods.ManyofwhicharenotcoveredbyIECorCECCspecifications.AlthoughanumberoftestmethodsareunderpreparationbyIECandCECCtheyareconsideredacceptableforuseinthisStandard.WheretestmethodshavebeenconsideredsuitableforinsertionintothisStandardtheyareeitherreferencedunderclause2.4-StandardTestMethodsordetailedinfullunderclause2.5-SpecialTestMethods.ExamplesofMMEUswhicharecoveredbythesetestmethodsare:-Amplifiers-Attenuators-Couplers/Powerdividers-Filters-Isolators/Circulators-Limiters-Mixers-NoiseSources-Oscillators-PhaseShifters-Switches-Transmitters(e.g.IntegratedMultichannel)GuidanceontheprimeelectricalcharacteristicstobemeasuredisgiveninannexCoftheBlankDetailSpecification(BDS)-EN160201.ThisPart2ofEN160200willbereviewedasothertestmethodsbecomeavailable.
【中国标准分类号】:L10
【国际标准分类号】:31_190
【页数】:88P;A4
【正文语种】:英语
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